California based Light Labs Inc. joins EMVA. Light is a provider of depth perception software and semiconductor IP intended for automotive OEMs and Tier 1 suppliers for ADAS/AV applications. The ... read more
News
EMVA's Forum for Machine Vision & Optical Metrology - the Control Vision Talks - consequently will not take place at Stuttgart fair ground this year. The decision is made: once ... read more
The world's leading trade fair for photonics components, systems and applications enables advance planning for exhibitors and visitors with new trade fair dates for spring 2022. In close coordination with ... read more
Dr. Dirk Berndt is Head of the Business Unit »Measurement and Testing Technology« at the Fraunhofer Institute for Factory Operation and Automation (IFF) in Magdeburg, Germany. Effective January 1st, 2021, ... read more
AI and Deep Learning: The EMVA is going forward with making interesting presentations available at its association website. Watch the keynote presentation of Alex Myakov from Intel at the 2017 ... read more
The EMVA is happy to welcome BASLER AG among its members. Basler is a leading international manufacturer of high-quality imaging components for computer vision applications. In addition to classic area ... read more
The EMVA today announced that FARO Europe joined the association. FARO is the leading global source for 3D measurement technology for 3D Metrology, AEC (Architecture, Engineering & Construction) and Public ... read more
EMVA welcomes AT - Automation Technology as new member. AT is a global market leader in the field of special imaging sensor technology. With its IR and 3D products they ... read more
The EMVA today announced that Kowa Optimed - well known producer of lenses since the 1940's - has joined the association. Kowa Optimed is part of Kowa Company Limited, one ... read more
Ernst Rauscher, company founder, partner and managing director of RAUSCHER GmbH, passed away on November 5th after several months of serious illness at the age of 74. Ernst Rauscher founded ... read more
