EMVA organizes Machine Vision Presentation Forum during Measurement World Exhibition in Paris
- Series of speeches on machine vision topics during first two trade show days
- Several EMVA member companies exhibit with their own booth
Barcelona/Paris, 05 September, 2019. EMVA is pleased to announce that it will contribute to the machine vision presence during the exhibition Measurement World with a presentation forum. The new biannual exhibition format Measurement World is dedicated to measurement in its broadest sense and takes place from September 24 – 26 in hall 4 at Paris Expo Port de Versailles. The machine vision presentations are given in French or English and free of charge for all visitors and will be held on Tuesday, 24 September from 2.00 pm – 5.00 pm and on Wednesday, 25 September from 9.30 am – 12.00 pm in ROOM 1 of hall 4.
Presentation topics include state of the art vision technology; the description of concrete machine vision applications in different industrial sectors; machine vision standards and their objectives as well as the description of the vision markets in France, in Europe and worldwide. Below the timetable including the presentation titles:
Tuesday, 24 September
| 14:00 – 14:30 | EMVA: Presentation and numbers
Jean CARON – Michel OLLIVIER – Members of the EMVA Board |
| 14:30 – 15:00 | State of the art of visible Machine Vision sensors
Yvan EILERS – SVS-VISTEK |
| 15:00 – 15:30 | Artificial Intelligence on edge devices for machine vision applications
Boris DUCHE – IDS |
| 15:30 – 16:00 | Illumination techniques for new vision applications (Hyperspectral, SWIR, 3D…)
Arnaud MESTIVIER – EFFILUX |
| 16:00 – 16:30 | How to use the Sony polarized camera technology for complex applications and open new fields for inspection?
Pascal CHEVALIER – I2S / Stéphane CLAUSS – SONY |
| 16:30 – 17:00 | Embedded vision : from optimization to miniaturization, key factors to succeed in the development of your applications
Elodie Rigaudiere / TECHWAY |
Wednesday, 25 September
| 9:30 – 10:00 | EMVA: Machine Vision standards
Jean CARON – Michel OLLIVIER – Members of the EMVA Board |
| 10:00 – 10:30 | Multiple object tracking, a challenge for machine vision
Romain BAUDE – APREX SAS |
| 10:30 – 11:00 | How to innovate and create value with public research?
Rodolphe BERNARD – INSAVALOR |
| 11:00 – 11:30 | Expand the reach of your inspection systems with infrared imaging technologies
Sébastien FRASSE-SOMBET – LYNRED (SOFRADIR/ULIS) |
| 11:30 – 12:00 | XRAY tomography services the industrial world
Laura CREON – SEMATEC |
EMVA members at Measurement World
Several EMVA members will exhibit at Measurement World with their own booths. These are ATD Electronique, Carl Zeiss, Edmund Optics GmbH, EFFILUX, IDS – Imaging Development Systems, Mettler Toledo, Precitec, Stemmer Imaging, SVS Vistek, and VS Technology. Furthermore, in addition to their trade fair booth ATD Electronique announced that the company offers its own conference program. More details on the program and how to register can be found on their websites www.atdelectronique.com/event-shows.
About EMVA:
Founded in May 2003 in Barcelona, the European Machine Vision Association currently has about 120+ members representing more than 20 nations. Its aim is to promote the development and use of machine vision technology and to support the interests of its members – machine vision companies, research institutions and national machine vision associations. The main fields of work of EMVA are: standardization, statistics, the annual EMVA Business Conference and other networking events, European research funding, public relations and marketing. To find out more visit the web site www.emva.org.
The well-chosen conference venue is the beautiful premises the Palais de la Bourse, the historic stock market in the heart of the city. Shortly before finalizing the program, the latest amendment was a “French Evening” presentation block covering machine vision activities in the hosting country. Four presentations from lighthouse institutions in French machine vision research and education will give insights in their fields of activity, namely the technology cluster Minalogic; LIRIS institute which is linked to University of Lyon; The French School for Vision Telecom Saint-Etienne & University Jean Monnet; and CEA-Leti institute based in Grenoble.
Werner Feith received his education from TU München as a solid state physicist. After some time with industrial computer industry he founded Sensor to Image GmbH, which started as a frame grabber company, but was soon tuned to be an FPGA IP company supporting digital camera interfaces defined by Gen<I>cam standard. Sensor to Image became and is the world leader in industrial camera interface IP supporting GigEVision, USB3-Vision and CoaXPress. After selling Sensor to Image in 2017 Werner Feith was attracted by the open position as EMVA Standards Manager to continue his career in the industry and share his vast experience in standardization.
Objects made from transparent materials play crucial roles in humans’ everyday life. They are employed, e.g., as windshields, glasses or as plastic lenses to guide laser beams in an eye surgery. Especially when considering the latter example, it is obvious, that such objects must meet high quality requirements. Hence, a visual inspection for material defects like enclosed air bubbles or surface scratches is inevitable. Human visual inspection is a fatiguing task which is not very robust and prone to subjective results or even to unrevealed defects. Automated visual inspection systems represent a reliable alternative to manual inspection. However, the automated inspection of complex-shaped transparent objects like lenses, windshields etc. still represents a challenging task with several open research questions.
Dr. Bernd Liepert is the President of euRobotics aisbl, the international non-profit association for all stakeholders in European robotics, which was founded in September 2012 and has become the private side of SPARC, the European Public-Private Partnership in Robotics in 2013. As president of these associations, Dr. Liepert has been leading the European robotics community and representing it at high political levels since 2008, where he became President of EUROP, the European Robotics Technology Platform.
In the afternoon session of the first conference day, Prof. Dr. Christian Wolf, Associate Professor at INSA, Université de Lyon and LIRIS, CNRS highlights reasoning as a key component of human intelligence in his speech “Learning High-Level Reasoning in and from Images”.
Barcelona/Suzhou (China), 08 April, 2019. During the meeting of the GenICam Standard Group end of March in Suzhou/China the Chair and Vice-Chairs were elected for another regular three year period. The previous incumbents were unanimously re-elected. Dr. Fritz Dierks (Basler) remains Chairman of the GenICam Standard Group and is assisted by the three Vice-Chairmen Rupert Stelz (STEMMER IMAGING), Stéphane Maurice (Matrox Imaging) and Christoph Zierl (MVTec Software).
