EVT EyeScan 3D inspection system detects defects during the production of solar cells
Germany's EVT Eye Vision Technology GmbH has released details of its EyeScan 3D, an inspection system that is used to detect failures and defects during the production of solar cells.
The system possesses what is referred to as the 'Solar Plug-in' which has been especially developed for the solar industry. The system detects the failure of materials, which increases production yield. The detection of micro-cracks and other wafer defects is important in order to avoid wafer breakage.
The system's high-resolution cameras are capable of discovering faults at an early stage in the manufacturing process, says the firm. The test system solves essential inspection tasks by detecting edge disruptions and checking for correct measurements. In addition, the position and rotation of a cell can be determined to enable it to be soldered easily.
The evaluation unit and the sensor are not only integrated into the EyeScan 3D system's cabinet but are also pre-calibrated. This means that users only have to look after the installation of the sensor. Experts who integrate and calibrate the system are unnecessary, says EVT. In addition, users are also able to replace an existing sensor with a new one without having to re-calibrate the system.
The evaluation processor can thread in up to 40 000 3D-profiles per second. The complete evaluation software is contained in the system and can be programmed using drag-and-drop routines. All topics can be realised - from simple test-method tasks to object recognition.
It is possible to read DMC, OCR/OCV and barcodes on silicon and solar cells. Results and the image data can be transferred via Gigabyte Ethernet, RS232 and RS485 interfaces. Measurement results also can be transferred to SAP and ORACLE systems via optional software interfaces, enabling relevant data to be available anywhere within a company and at any time.
Contact:
EVT Eye Vision Technology GmbH
Haid-und-Neu-Str. 7
D-76131 Karlsruhe
Germany
Phone: +49-721-626-905-82
Fax: +49-721-626-905-96
Email: sales@evt-web.com
Web: http://www.evt-web.com
The system possesses what is referred to as the 'Solar Plug-in' which has been especially developed for the solar industry. The system detects the failure of materials, which increases production yield. The detection of micro-cracks and other wafer defects is important in order to avoid wafer breakage.
The system's high-resolution cameras are capable of discovering faults at an early stage in the manufacturing process, says the firm. The test system solves essential inspection tasks by detecting edge disruptions and checking for correct measurements. In addition, the position and rotation of a cell can be determined to enable it to be soldered easily.
The evaluation unit and the sensor are not only integrated into the EyeScan 3D system's cabinet but are also pre-calibrated. This means that users only have to look after the installation of the sensor. Experts who integrate and calibrate the system are unnecessary, says EVT. In addition, users are also able to replace an existing sensor with a new one without having to re-calibrate the system.
The evaluation processor can thread in up to 40 000 3D-profiles per second. The complete evaluation software is contained in the system and can be programmed using drag-and-drop routines. All topics can be realised - from simple test-method tasks to object recognition.
It is possible to read DMC, OCR/OCV and barcodes on silicon and solar cells. Results and the image data can be transferred via Gigabyte Ethernet, RS232 and RS485 interfaces. Measurement results also can be transferred to SAP and ORACLE systems via optional software interfaces, enabling relevant data to be available anywhere within a company and at any time.
Contact:
EVT Eye Vision Technology GmbH
Haid-und-Neu-Str. 7
D-76131 Karlsruhe
Germany
Phone: +49-721-626-905-82
Fax: +49-721-626-905-96
Email: sales@evt-web.com
Web: http://www.evt-web.com
